Mostrar registro simples

dc.contributor.authorFadanelli Filho, Raul Carlospt_BR
dc.contributor.authorGrande, Pedro Luispt_BR
dc.contributor.authorBehar, Monipt_BR
dc.contributor.authorDias, Johnny Ferrazpt_BR
dc.contributor.authorCzerski, Konradpt_BR
dc.contributor.authorSchiwietz, Gregorpt_BR
dc.date.accessioned2015-01-27T02:13:16Zpt_BR
dc.date.issued2006pt_BR
dc.identifier.issn1098-0121pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/109245pt_BR
dc.description.abstractThe aim of this work is to investigate how the mean energy loss and straggling due to H2 + molecules interacting with silicon are affected by the Coulomb explosion and vicinage effects. To that end, a SIMOX-type sample made up of 18 O and with an appropriate 18O marker grown over the surface of crystalline Si was employed, allowing to carry out the measurements through the 18 O (p, α)15N resonant reaction at 151.2 keV under channeling and random directions. The results show that the mean energy loss associated with the Coulomb explosion and vicinage effects are similar and amount each to about 2% of the total mean energy loss. The comparison of the energy straggling obtained for molecular beams at random and the well-aligned 100 direction shows a larger value for the aligned case, which is interpreted as a result of the Coulomb explosion along the channel direction. The experimental results are also discussed in terms of Monte Carlo simulations.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofPhysical review. B, Condensed matter and materials physics. Woodbury. Vol. 73, no. 24 (June 2006), 245336 7p.pt_BR
dc.rightsOpen Accessen
dc.subjectCanalizaçãopt_BR
dc.subjectSemicondutores elementarespt_BR
dc.subjectPerda de energia de particulaspt_BR
dc.subjectFeixes molecularespt_BR
dc.subjectMétodos de Monte Carlopt_BR
dc.subjectSilíciopt_BR
dc.titleInterplay between the Coulomb explosion and vicinage effects studied using H/sub 2//sup +/ molecules under channeling conditionspt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000549734pt_BR
dc.type.originEstrangeiropt_BR


Thumbnail
   

Este item está licenciado na Creative Commons License

Mostrar registro simples