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dc.contributor.authorGeshev, Julian Penkovpt_BR
dc.contributor.authorNicolodi, Sabrinapt_BR
dc.contributor.authorPereira, Luis Gustavopt_BR
dc.contributor.authorNagamine, Luiz Carlos Camargo Mirandapt_BR
dc.contributor.authorSchmidt, Joao Edgarpt_BR
dc.contributor.authorDeranlot, Cyrilept_BR
dc.contributor.authorPetroff, Frédéricpt_BR
dc.contributor.authorRodríguez-Suárez, Roberto Lazaropt_BR
dc.contributor.authorCosta, Antonio Azevedo dapt_BR
dc.date.accessioned2015-01-21T02:17:22Zpt_BR
dc.date.issued2007pt_BR
dc.identifier.issn1098-0121pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/109091pt_BR
dc.description.abstractFerromagnetic resonance FMR and magnetization MAG measurements were used to study the exchange interaction between the antiferromagnetic and ferromagnetic layers in an IrMn/Cu/Co system as a function of the Cu spacer thickness. Although the experimental angular variations of the exchange-bias fields Heb FMR and Heb MAG coincide, the coupling strengths J and the Co layers’ anisotropy fields HU, obtained via numerical simulations, are different. For all Cu thicknesses JFMR >JMAG and HU FMR< HU MAG. The exchange coupling decreases exponentially with the spacer thickness and is a short-range interaction. These characteristics were explained in the framework of a model considering polycrystalline magnetic layers with independent easy axis distributions, taking into account the rotatable anisotropy. The role of antiferromagnetic grains at the interface with different sizes and different magnetic stabilities is essential for understanding the behavior of this exchange-biased system.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofPhysical review. B, Condensed matter and materials physics. Woodbury. Vol. 75, no. 21 (June 2007), 214402 5p.pt_BR
dc.rightsOpen Accessen
dc.subjectAnisotropia magnéticapt_BR
dc.subjectInterações de troca (elétron)pt_BR
dc.subjectRessonancia ferromagneticapt_BR
dc.subjectMagnetizaçãopt_BR
dc.subjectPolarização por intercâmbiopt_BR
dc.titleExchange bias through a Cu interlayer in an IrMn/Co systempt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000595337pt_BR
dc.type.originEstrangeiropt_BR


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