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dc.contributor.authorLimandri, Silvina P.pt_BR
dc.contributor.authorVasconcellos, Marcos Antonio Zenpt_BR
dc.contributor.authorHinrichs, Ruthpt_BR
dc.contributor.authorTrincavelli, Jorge C.pt_BR
dc.date.accessioned2014-10-14T02:13:11Zpt_BR
dc.date.issued2012pt_BR
dc.identifier.issn1050-2947pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/104535pt_BR
dc.description.abstractCross sections for K-shell ionization by electron impact were determined from films of Al, Si, and Ti and their oxides deposited on carbon substrates, for incident energies between 2.5 and 25 keV. The spectral processing of the x-ray emission spectra took into account corrections due to the presence of a spontaneous oxide layer formed on the monoelemental films and to the supporting material. CarbonK-shell ionization cross sections were determined from the contribution of the substrate to the measured spectra, while for oxygen, data from the three oxide films were taken. The mass thickness of the coatings was characterized by x-ray reflectivity. The results obtained were compared with other experimental data sets, semiempirical approaches, and theoretical models.en
dc.format.mimetypeapplication/pdf
dc.language.isoengpt_BR
dc.relation.ispartofPhysical review. A, Atomic, molecular, and optical physics. New York. Vol. 86, n. 4 (Oct. 2012), 042701, 10 p.pt_BR
dc.rightsOpen Accessen
dc.subjectFísica da matéria condensadapt_BR
dc.subjectIonizacao de atomospt_BR
dc.titleExperimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Tipt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000863282pt_BR
dc.type.originEstrangeiropt_BR


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